WavePulser 40iX 高速互连分析仪

WavePulser 40iX validates, debugs and troubleshoots interconnectivity issues in serial data cables, channels, connectors, vias, backplanes, printed-circuit boards, and chip and SoC packages. It is simple to set up and use. It provides the same results as a network analyzer for a fraction of the price.

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WavePulser 40iX calibration standards are built-in, so calibration is always automated, simple and fast. Compare to a vector network analyzer that requires purchase of additional, external calibration standards and requires manual connection for calibration. The TDR/TDT-based approach is also independent of setup, making calibration less frequent.

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WavePulser 40iX delivers time domain reflectometer (TDR) step response and time-gated and/or emulated physical-layer responses with no need for extrapolation to DC and low frequencies - ideal for high-speed serial data interconnect analysis.

One acquisition displays all measurement results: mixed-mode return and insertion losses for all ports; differential-mode and common-mode measurements; DC frequency response. A tabular graphical user interface makes reading results straightforward.

A simple setup requires you to enter only frequencies and number of ports for a single-ended acquisition. Choose a test time optimized for accuracy or speed or something in between. Reconfigure ports in software without reconnecting to the DUT. Reorder S-parameters in the Touchstone file.

Internal, electronic calibration permits measurements to begin sooner and be made with more confidence. Capabilities such as passivity, reciprocity and causality enforcement ensure higher S‑parameters measurement accuracy.

Eliminate the effects of cables and connectors from results. Set gating through port extension or an impedance peeling algorithm, and save S‑parameters with or without the gating region. De‑embed serial data channels using modeled or measured S‑parameters.

Import or simulate waveforms and use S‑parameters to model impairments. Quickly view the impact of impairments with an intuitive serial data eye diagram. View the effects of de‑embedding and equalization on the eye diagram. Supports PLL, pre‑emphasis, de‑emphasis, CTLE, FFE and DFE.

Measure total (Tj), random (Rj) and deterministic (Dj) jitter. De-convolve Dj into component parts. View jitter in spectral, histogram, jitter track, eye diagram and other plots.